EE Product News

Land-Grid Array Sockets Aid Testing, Characterization

Providing virtually invisible interconnection between the device lands and DUT board pads for manual device characterization and automated production testing, Land-Grid Array (LGA) test sockets offer firm's Fuzz Button contact pins that are made from a single length of gold-plated wire that is compressed into cylindrical shape to produce contact elements with excellent electrical characteristics. The distortion signal paths support high repeatability in all test modes.

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