Microchip Technology said it will continue using Teradyne’s J750 family and FLEX test platform systems for testing its portfolio of microcontroller products, including their high-performance dsPIC digital signal controller product line. The J750 and FLEX test platforms are well-suited for testing microcontroller peripherals like Ethernet, USB, and high-resolution ADCs and DACs, according to a company release. Microchip was the first customer for the J750, which was specifically designed to meet the parallel test requirements of high-volume, cost-sensitive devices like microcontrollers, according to Ian Lawee, marketing manager for Teradyne. The J750Ex expands the J750 platform capability to meet new critical test requirements for digital, DFT, embedded memory, analog and power-supply testing, and offers over 98 percent parallel test efficiency, according to the release. The J750 software, IG-XL, was designed from the ground-up for high-throughput, multisite testing, and has become the standard software system for all Teradyne semiconductor test systems. Microchip extended the contract through 2009.