Packaging/Interconnects: Test Socket With RF Center Probe Eliminates Package-Lead Damage

Nov. 10, 2003
A high-frequency center-probe test socket features a floating guide plate with a built-in hand stop to protect probes during test and eliminate damage to the package leads. Well suited for automated handler testing in 1- to 10-GHz applications, it...

A high-frequency center-probe test socket features a floating guide plate with a built-in hand stop to protect probes during test and eliminate damage to the package leads. Well suited for automated handler testing in 1- to 10-GHz applications, it can be used for 0.50-mm pitch (or more) packages in devices up to 55 mm wide. Decoupling pockets of the socket can be placed within 1.0 mm of the probes, enabling users to place biasing or decoupling components right next to the probes. This results in less noise and faster test time. The socket is available in custom materials, platings, sizes, and configurations. A 256-lead 2-GHz package starts at $1464 with six-week delivery.

Aries Electronics Inc.www.aireselec.com; (908) 996-6841

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