Learn Strategies for Reducing Cost of Test at the 2008 Automated
Test Summit
Leading test and measurement companies worldwide are taking part in this
virtual industry event, hosted by National Instruments, to share their
tips and best practices for reducing cost of test. By participating in
this online event, you can experience the presentations, exhibitors, and
dynamic atmosphere of a traditional conference — all from the
convenience of your desk. Access session
overviews and register for this free event.
More powerful cameras and greater video-analysis capabilities push
intelligent video beyond traditional industrial uses to surveillance,
consumer, automotive, and other applications.
Integrated silicon photodetectors and other compound semiconductors
serve a range of applications while yielding record-performance results
that make for a bright future.
Standard board form factors typically support parallel and serial
interfaces. But as their availability grows, they're gently nudging out
the older standards.
