70-GHz Modular Sampling Scope Measures 200-fs System Jitter

Aug. 23, 2004
The TDS8200 modular sampling oscilloscope and 82A04 phase-reference module from Tektronix enable system jitter measurements of 200 fs rms. According to the company, these devices represent performance benchmarks for testing high-speed serial data...

The TDS8200 modular sampling oscilloscope and 82A04 phase-reference module from Tektronix enable system jitter measurements of 200 fs rms. According to the company, these devices represent performance benchmarks for testing high-speed serial data signals from 2.0 to 12.5 Gbits/s.

The TDS8200 single-ended and differential clock-recovery sampling oscilloscope covers all emerging serial-data transmission standards from 50 Mbits/s to 12.5 Gbits/s. It can be configured with plug-in modules to provide bandwidths up to 70 GHz. The scope features up to eight input channels, a reflected rise time of 35 ps, and four color-coded variable-persistence waveform databases. Low-jitter measurements are possible using both conventional free-run and triggered operating modes.

The 8204A incorporates a reference clock with an optional continuous input frequency range of 2 to 60 GHz (2 to 25 GHz without an option). Combined with the Tektronix 80E0x electrical signal-acquisition module, it provides total electrical signal analysis and clock recovery for differential and single-ended signals.

The TDS8200 oscilloscope costs $20,490, while the 82A04 module goes for $28,990.

Tektronix Inc.www.tektronix.com (800) 833-9200

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