EE Product News

New Optical Testers Detect High-Speed Telecomm Nets' Jitter

Melding a Digital Phase Analysis (DPA) module with a member of the OTS9000 family of optical test systems is said to provide the means for meeting the 10-Gb/s test requirements for SONET/SDH and other high-speed telecomm networks. Employing silicon germanium (SiGe) ICs, the DPA modules are said to represent an innovative, best-in-market jitter and synchronization testing technology that allows engineers to perform 10-Gb/s jitter testing on data as well as clocks with low intrinsic noise, high jitter accuracy, wide dynamic range, flexible jitter bandwidths, and fast settling times. The 10-Gb/s jitter and synchronization module is able to analyze wander at 10 Gb/s, as well as jitter and wander at 2.5 Gb/s, 622 Mb/s and 155 Mb/s through a software upgrade. Based on a modular, common-platform concept, the OTS9000 series of instruments is said to be the first optical test system designed to test dense wavelength-division multiplexing (DWDM) systems at 10 Gb/s. The module and test platform is scheduled to become available in early 2001.

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