A full line of high-speed test probes have been designed to perform high cycle, high reliability IC testing and have operating lengths as short as 2.5 mm (.098") to assure less than 1 nH self inductance. Featuring bandwidths up to 7 GHz, they are available for testing devices with centerlines as small as 0.5 mm. These test probes come in a variety of tip styles to accommodate different analog and digital devices that require testing. Operating lengths can be customized to meet Z-tolerance requirements. Probes are priced according to size, style, and quantity. Literature and pricing is provided upon request.
Company: RIKA DENSHI AMERICA INC.
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