Electronicdesign Com Products Test And Measurement Probe S Short Electrical Lengths Assure Low Self I
Electronicdesign Com Products Test And Measurement Probe S Short Electrical Lengths Assure Low Self I
Electronicdesign Com Products Test And Measurement Probe S Short Electrical Lengths Assure Low Self I
Electronicdesign Com Products Test And Measurement Probe S Short Electrical Lengths Assure Low Self I
Electronicdesign Com Products Test And Measurement Probe S Short Electrical Lengths Assure Low Self I

Probe's Short Electrical Lengths Assure Low Self Inductance

Aug. 1, 2000
A full line of high-speed test probes have been designed to perform high cycle, high reliability IC testing and have operating lengths as short as 2.5 mm (.098") to assure less than 1 nH self inductance. Featuring bandwidths up to 7 GHz, they are

A full line of high-speed test probes have been designed to perform high cycle, high reliability IC testing and have operating lengths as short as 2.5 mm (.098") to assure less than 1 nH self inductance. Featuring bandwidths up to 7 GHz, they are available for testing devices with centerlines as small as 0.5 mm. These test probes come in a variety of tip styles to accommodate different analog and digital devices that require testing. Operating lengths can be customized to meet Z-tolerance requirements. Probes are priced according to size, style, and quantity. Literature and pricing is provided upon request.

Company: RIKA DENSHI AMERICA INC.

Product URL: Click here for more information

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