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Simulation Tools Ease Optical Measurements

Sept. 8, 2010
Software tool simulates compact spectral-selective semiconductor sensors for precise inline measurements.

Forecasting shorter development times, the company’s software tool simulates compact spectral-selective semiconductor sensors for precise inline measurements. The software helps users choose the right sensor as well as the optimal combination of filters and illumination. It provides different sensor models for color measurement and a combination is simulated and optimized on the basis of radiometric calculation rules. Additionally, the tool is suitable for validating the requirements of both new and existing applications. MAZeT GMBH, Jena, Germany. +49 3641 2809-0.

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