EE Product News

Test Clips Are Window Into Fine-Pitch ICs

A new family of Micro SMD Grabber test clips can be used with virtually any fine-pitch IC, including QFP, PQFP, SSOP, TSOP and TSSOP packages. Suited for use in R&D labs for prototype design and debugging, the clips are offered in three styles, including both short and long tips for 0.8 mm to 0.5 mm lead pitches and one for lead pitches as small as 0.3 mm.Unlike multi-contact clips that are limited to use with a single package style, the Micro SMD Grabber clips can be used on a variety of ICs. They’ll quickly attach to any IC lead, eliminating the need for labor-intensive soldering. Their thin body design allows for side-by-side stacking for adjacent lead probing.

Company: POMONA ELECTRONICS

Product URL: Click here for more information

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