This seminar describes the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.
By participating in this seminar, you will learn and understand:
- Measurement techniques required for measuring very small currents
- Sources of measurement error that will affect such low current measurements
- Measurement solutions that can be used in low current measurement applications
Presenter: John Tucker is the Senior Marketer for Keithley’s Scientific Research Instruments and Research and Education business at Keithley Instruments in Cleveland, Ohio.