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    1. Technologies
    2. Test & Measurement

    White Paper: Safe Operating Area -- Improving Reliability by Monitoring Device Stress Limits

    Nov. 12, 2010

    Download this brief form to access these two important application notes from LeCroy:

    • Safe Operating Area --Improving Reliability By monitoring Device Stress Limits
    • Power Device Analysis-- Measuring Power Loss in Switched Mode Power Supplies.


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