If you are unable to view HTML you can click here to view this message in your browser.
New Webcast:
Advances in Mixed Signal Testing presented by LeCroy and Electronic Design
FEATURES
ENGINEERING FEATURE
·
Don Tuite
New "GIG" Becomes More Of A Reality
As the implementation of the Global Information Grid begins, engineers stand by as practical challenges could lead to new job opportunities.
TECHNOLOGY REPORT
·
Roger Allan
MEMS On The Move: Motion Sensors For The Masses
Applications reap the benefits of steady advances in low-cost, low-power, and small-size advances in a maturing MEMS sensor technology.
ENGINNERING ESSENTIALS
·
Louis E. Frenzel
Put High-Speed Communications To The Test
Faster serial-data links push test and measurement technology to its limits in the battle against skew, noise, and jitter.
DEPARTMENTS
LEAPFROG: FIRST LOOK
·
William Wong
Software Probes Monitor And Repair Applications
The SensorPoint technology puts new code in existing applications for debugging and patch delivery.
DESIGN SOLUTION
·
William E. Lamie, Express Logic Inc.
Rise Of Multiprocessing/Multithreading Sharpens Focus On Interrupts
Using multiprocessing and multithreading architectures in conjunction helps generate higher performance in a range of applications.
IDEAS FOR DESIGN
·
High-Speed Full-Wave Rectifier Requires No Diodes, Few Parts
By Michael Wong and Tamara Papalias, Intersil Corp. · Use Current-Mirror Biasing To Avoid Squegging In RF Oscillators
By Madhu Siddalingaiah, SEA Corp. COMPONENT VIEW · Optoelectronics
TECHVIEW THE INDUSTRY · Kristina Fiore · OLED TVs Get Ready To Hit The Japanese Market ANALOG & POWER · Don Tuite · Arc-Detecting Circuit Breakers Will See Wider Use DIGITAL · Daniel Harris · FPGAs Boot In A Flash EDA · David Maliniak · Productivity Gains Eliminate Verification Bottlenecks TEST · Louis E. Frenzel · Instrumentation 2.0: How Software-Defined Instrumentation Is Changing T&M COLUMNSSPONSORED EDITORIAL EDITORIAL · Mark David Following Engineering Passions Earns Admission To The Lunatic Fringe PEASE PORRIDGE · Bob Pease Bob's Mailbox POINT OF VIEW · Jeff Bock, Freescale Semiconductor Yes, You Can Easily Shift From 8-Bit to 32-Bit MCUs DESIGN FAQsFingerprint AuthenticationElectronic Design TOC e-Newsletter Contacts
45 Eisenhower Dr., 5th Floor
Paramus, NJ 07652
USACopyright © 2007 Penton Media, Inc., All rights reserved.
By Michael Wong and Tamara Papalias, Intersil Corp. · Use Current-Mirror Biasing To Avoid Squegging In RF Oscillators
By Madhu Siddalingaiah, SEA Corp. COMPONENT VIEW · Optoelectronics
TECHVIEW THE INDUSTRY · Kristina Fiore · OLED TVs Get Ready To Hit The Japanese Market ANALOG & POWER · Don Tuite · Arc-Detecting Circuit Breakers Will See Wider Use DIGITAL · Daniel Harris · FPGAs Boot In A Flash EDA · David Maliniak · Productivity Gains Eliminate Verification Bottlenecks TEST · Louis E. Frenzel · Instrumentation 2.0: How Software-Defined Instrumentation Is Changing T&M COLUMNSSPONSORED EDITORIAL EDITORIAL · Mark David Following Engineering Passions Earns Admission To The Lunatic Fringe PEASE PORRIDGE · Bob Pease Bob's Mailbox POINT OF VIEW · Jeff Bock, Freescale Semiconductor Yes, You Can Easily Shift From 8-Bit to 32-Bit MCUs DESIGN FAQsFingerprint AuthenticationElectronic Design TOC e-Newsletter Contacts
Editor: Mark David
Send e-mail to: [email protected]
Advertising/Sponsorship Opportunities: Bill Baumann
Send e-mail to: [email protected]
45 Eisenhower Dr., 5th Floor
Paramus, NJ 07652
USACopyright © 2007 Penton Media, Inc., All rights reserved.