EE Product News

Laser Probe System Provides Design Verification Of Flip-Chip ICs

Based on Phase Interforometer Detector (PID) technology, the IDS 2500 is a high-precision timing measurement tool for design verification and failure analysis of leading-edge flip-chip ICs. The flip-chip probe system uses PID technology to speed access to critical waveforms that designers and product development engineers need to debug new high end flip-chip logic devices.
The probe system speeds the analysis of first silicon—and thereby speed up time-to-market—by combining faster acquisition time and greater signal strength with the proprietary PID, which adjusts the laser scanning microscope and makes it easier to use. Proven on chips made using 0.18-micron processes, the IDS 2500 system's new 2-ms duty cycle capabilities enable it to debug complex ICs that require a long test loop length.


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TAGS: Components
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