EE Product News

ATPG Tool Delivers Design-For-Test Solution

In its latest version, FastScan 2001 automatic test pattern generation (ATPG) tool reportedly can reduce test pattern sizes by as much as 60%. It can also test small embedded memories and other macros that are common in today’s SoCs. And addressing the trend towards multi-million gate designs, the app delivers new ATPG pattern compression capabilities targeted at designs containing multiple clocks. It also features fault sampling, whereby a percentage of a design’s entire fault list is sampled in order to assess the coverage and/or testability issues of a circuit.

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