Electronic Design

EDA News

The first 65-nm X architecture test chip has been produced at Applied Materials' Maydan Technology Center in Sunnyvale, Calif. Applied Materials leveraged its wafer fabrication equipment and processes along with lithography equipment from Canon USA Inc. and design tools and expertise from Cadence. The X architecture represents an efficient means of orienting a chip's interconnects using diagonal pathways in addition to traditional right-angle, or Manhattan, routing. Learn more at www.xinitiative.org.

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