<?xml version="1.0" encoding="utf-8"?><urlset xmlns="http://www.sitemaps.org/schemas/sitemap/0.9" xmlns:news="http://www.google.com/schemas/sitemap-news/0.9" xmlns:image="http://www.google.com/schemas/sitemap-image/1.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.sitemaps.org/schemas/sitemap/0.9 http://www.sitemaps.org/schemas/sitemap/0.9/sitemap.xsd http://www.google.com/schemas/sitemap-news/0.9 http://www.google.com/schemas/sitemap-news/0.9/sitemap-news.xsd"><url><loc>https://www.electronicdesign.com/directory/test-measurement/press-release/55377699/spectrum-instrumentation-new-awg-function-accelerates-automated-testing-processes</loc><news:news><news:publication><news:name>Electronic Design</news:name><news:language>en</news:language></news:publication><news:publication_date>2026-05-14T14:12:49.000Z</news:publication_date><news:title>New AWG function accelerates automated testing processes</news:title></news:news></url><url><loc>https://www.electronicdesign.com/directory/test-measurement/analyzers/press-release/55377677/rigol-rigol-dna5000-6000-series-vector-network-analyzers-in-mri</loc><news:news><news:publication><news:name>Electronic Design</news:name><news:language>en</news:language></news:publication><news:publication_date>2026-05-14T13:14:30.000Z</news:publication_date><news:title>RIGOL DNA5000/6000 Series Vector Network Analyzers in MRI</news:title></news:news></url></urlset>