EE Product News

Analyzer Tests 300-mm Probe Card Arrays

Enhancing the capabilities of the Probilt PB6500 probe card analyzer is a 12" diameter tungsten-carbide measurement chuck with dual cameras and extended stage travel that allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface. The system can be expanded up to 12,000 test channels with optional software-selectable relay or FET drive available on all channels. Combined with the higher chuck lift capability of 180 kg, the analyzer is suitable for use with all probe card technologies, including those being used to test the largest memory arrays on the latest test platforms. For more details, call INTEGRATED TECHNOLOGY CORP., Tempe, AZ. (480) 968-3459.


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