EE Product News

Module/Software Accelerates C-V/I-V/Pulse Testing

Complimenting the Model 4200-SCS semiconductor characterization system, the Model 4200-CVU module plugs into any available instrument slot in the system, allowing fast and easy capacitance measurements from fF to nF at frequencies from 10 kHz to 10 MHz. Its design provides intuitive point-and-click setup, simple cabling, and built-in element models that eliminate guesswork in obtaining valid C-V measurements. The module also includes an extensive set of test libraries and a variety of diagnostic tools to help ensure the validity of C-V test results. The Model 4200-CVU and optional kits will be available in December. Pricing is $13,000. KEITHLEY INSTRUMENTS INC., Cleveland, OH. (800) 688-9951.


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