Date: Thursday, June 14, 2018
Time: 2:00 PM Eastern Daylight Time
Duration: 60 Minutes
With PAM4 moving into production and 400G design efforts in full swing, the test challenges around characterization, verification and debug, and manufacturing testing have never been greater.
This in-depth discussion on new technologies and techniques for 100G/400G optical transmitter (TX) testing will help you accelerate your product development and maximize your manufacturing test efforts.
You will learn:
- 100G/400G PAM4 from R&D to production. Learn how to enable a seamless transition from design to manufacturing workflows.
- PAM4 debug and validation. The move to PAM4 modulation presents validation and debug challenges that real-time oscilloscope-based solutions can address by means of advanced equalization and digital clock recovery, effective error rate analysis, and offline analysis capabilities.
- Higher sensitivity and lower noise for manufacturing. Manufacturers need both to increase production capacity and improve yields for 400G designs moving into production.
- New software solutions. Learn how advances in software are also playing a key role in driving significant improvements in manufacturing yield for next generation optical components and interconnects and further speed 400G debug and troubleshooting.
Optical Networking Market Segment Lead
Karen Brownell is an Optical Networking Market Segment Lead at Tektronix, specializing in Transmitter Optical Test solutions including Sampling and Real Time Scopes. She has worked at Tektronix for over 3 years. Karen has a MBA from St Edwards University and a BS from Pennsylvania State University.