Date: Tuesday, May 15, 2018
Time: 2:00 PM Eastern Daylight Time
Duration: 60 Minutes
The development and production of optoelectronics devices such as laser diodes is accelerating due to a rising number of 3D sensing applications such as facial recognition, gesturing, automotive safety, autonomous driving vehicles, augmented reality in gaming and consumer products, and human-machine interfaces and robotics in industrial applications. In these applications, the Vertical Cavity Surface Emitting Laser (VCSEL) is one of the primary components used in 3D sensing applications. VCSELs are a type of semiconductor laser diode with laser beam emission perpendicular from the top surface, as compared to a conventional edge-emitting semiconductor.
The successful deployment of VCSELs/Laser Diodes in 3D sensing applications will not be accomplished without repeatable and accurate DC electrical testing. The most common subset of DC characteristics can be measured in a test known as the L-I-V test sweep. This test can quickly identify failed on-wafer components and devices early in the production and test process. Depending on whether you are testing a single VCSEL that outputs only a few milli-watts, a VCSEL array consisting of hundreds of VCSELs per square millimeter that can output a couple of watts, or even VCSEL arrays used in 3D sensing that have the power to illuminate distance up to a couple of hundred meters, you will need to take into consideration potential sources of measurement error that can impact measurement integrity on your VCSEL laser diode modules.
This webinar focuses on LIV measurements on Laser Diodes that can be used in 3D sensing applications. The discussion will explore the challenges associated with highly synchronized pulse testing to achieve electrical measurement efficiency, thermal management and increased throughput.
In this Webinar, you will learn:
- Why Laser Diodes are used in 3D sensing applications
- What measurement parameters of LIV testing are required and why they are so important
- The use of synchronized pulse testing to detect and capture light power
- What can or will go wrong when you develop your LIV test system
- What test instrumentation is recommended for LIV testing
John Tucker is the Product Marketer for the Keithley Source Measure Unit product line of Tektronix, Inc. He has been with Keithley for over 28 years, serving in a variety of positions including test engineer, applications engineer, applications manager, product manager, and business development manager.