Date: Friday, December 14, 2018
Time: 2:00 PM Eastern Standard Time
Sponsor: Texas Instruments
Duration: 30 Minutes
Robust and reliable isolation is required not just for system protection, but also for quality and efficiency. Certification at system-level for isolation is critical – but do you know how modern isolation technology is measured for reliability? Careful consideration of the materials, manufacturing reliability, and consistency of performance of an isolation component can have a significant impact in maintaining consistent and reliable operation of your overall isolation solution. In this webinar, TI’s isolation development team will share insights into common questions about modern isolation technology.
- How is quality and reliability of isolation technology tested?
- How could isolation technology impact signal integrity?
- How does capacitive technology enable new levels of system performance in industrial and automotive design?
Tom Bonifield is a TI Fellow in the Analog Technology Development group in Texas Instruments. Most recently, Tom is focusing on high voltage processes, materials and structures. His long term technical focus has been on development of semiconductor interconnect materials and manufacturing processes for new Integrated Circuit technologies. Tom joined TI in 1979 after receiving his Ph.D. in Physics from Rice University.