Event Type: Live Webinar
Duration: 1 Hour
The faster switching transitions on modern power devices has made measuring and characterizing a considerable challenge, and in some cases, near impossible. IsoVuTM technology from Tektronix allows designers to accurately measure half bridge and gate driver waveforms that were previously hidden. During our live webinar, you will learn:
- How to overcome measurement challenges on gate drivers and half bridges
- Common sources of measurement error
- Why a typical probe’s poor common mode rejection can cause misleading measurements
- How IsoVuTM technology has created opportunities in CMTI, ESD testing, and the double pulse test
Wilson Lee, Technical Marketing Manager, Tektronix
Wilson Lee is Technical Marketing Manager at Tektronix. Wilson has over 25 years of technical marketing, technical sales leadership roles with manufacturers such as CTS Electronic Components, as well technical/value-add distributors such as Richardson RFPD and Premier Farnell. Wilson has focused heavily on design and design engineer engagement within the RF/Wireless, Industrial Power, and Industrial Automation market segments.
Wilson earned his Bachelors of Science Degree at Cornell University. He has lived in New York, Chicago and Asia through his career and currently resides in Portland, Oregon.