Date: Thursday, November 15, 2018
Time: 2:00 PM Eastern Standard Time
Duration: 60 Minutes
For more than 50 years, power semiconductor manufacturers have been pursuing the elusive goal of creating the “Perfect Switch” that offers high voltage blocking capabilities in the off-state, zero resistance in the on-state, high switching speeds, long-term reliability, and low cost. The adoption of wide bandgap materials such as SiC and GaN enables greater efficiency, but how do you keep production costs low while meeting these demanding measurement requirements? Join us as we discuss how to perform fully automated, wafer-level measurements from pico-amps to kilo-volts in a single-pass without manually changing the test set-up or equipment.
Mark A. Cejer
Director, Product Management & Marketing
Mark A. Cejer is responsible for leading the Keithley Semiconductor Test Systems business, part of the Tektronix test and measurement portfolio. Since 1991 Mark has served in a variety of positions associated with Keithley products, including Marketing Director, Regional Sales Manager, and Product/Marketing Manager. He led the creation and launch for numerous Keithley instruments, including Keithley SourceMeter® SMU instruments, digital multimeters (DMMs), and datalogging products. Prior to 1991, he served in several project management and electrical engineering positions in the electronics industry. He holds a BSEE from the University of Akron (Akron, Ohio) and an MBA from Case Western Reserve University (Cleveland, Ohio). His technical interests include analog semiconductors for power, automotive, and communications applications, as well as wide bandgap and IoT devices.
Chief Solutions Engineer
Joe is a Chief Solutions Engineer focused on the Keithley Semiconductor Systems Business, part of the Tektronix test and measurement portfolio. The CSE is a recently created role to help seamlessly connect customer requirements and needs with Keithley product offerings. Prior to this role he spent 20 years as a Mechanical Engineer in new product development. He has a B.S.M.E. from the University of Akron.
Business Development Manager, Parametric Systems and Failure Analysis
Mark is currently the Business Development Manager for Keithley Parametric Systems and Failure Analysis Solutions, part of the Tektronix test and measurement portfolio. Mark joined Tektronix in 2015. Before joining Tektronix, Mark held a variety of sales and marketing management positions at Hewlett-Packard, Agilent Technologies, and Keithley Instruments, among others.