Available On Demand
As semiconductor technologies continue to follow Moore’s law, research on semiconductor devices is increasingly going below 10 nanometers or 10 nanoseconds. Our panel will discuss three cases where either shrinking sizes or faster speeds is changing device measurement methods for the newest memory, integrated circuits and sensor devices.
Memory devices, for example, need to be faster and more efficient. As a result, non-volatile memory testing increasingly requires pulsing at less than 10 nanoseconds.
The shrinking size of integrated circuit components increasingly requires IC designers and failure analysis engineers to perform nanoprobing in scanning electron microscope (SEM) to characterize the performance of microchips, and locate and analyze the root cause of defects. The positioning resolution of nanoprobers is no longer the only key factor of the nanoprobing system.
And finally, while not at nano speeds, the measurement of sensor devices such as high efficiency dual diode detectors increasingly requires current-voltage and capacitance-voltage measurements with setup changes that are fast and efficient.
Our panel will discuss new measurement methods and their implications for test system setups for each of these device types.
Bradley Odhner is an Applications Engineer for the Keithley Instruments product line at Tektronix. He worked closely on the development of the 4200A-SCS and the CVIV multi-switch and was responsible for many of the 4200A-SCS’ over 450 application focused tests including the characterization of memory and other transistor reliability tests. He is currently responsible for customer applications of Keithley SourceMeters® instruments and DMMs. He has a BA in Physics from Case Western Reserve University where he researched 2-D material transistors.
Jim Bucci is an Applications Engineer with the Keithley Parameter Analyzer product line at Tektronix. Jim joined Keithley in 2015 as a Test Engineer and has since worked with SMUs, Digital Multimeters, Parameter Analyzers, and Production Semiconductor Testers. Prior to joining Keithley, he worked as an engineer at National Instruments and studied and earned a BS in Electrical Engineering at Case Western Reserve University.
Market Segment Manager, Keithley Instruments Product Line
Katie Wright is a Market Segment Manager at Tektronix for the Keithley Instruments product line. She is responsible for defining and shaping the next generation of products for semiconductor, material science and electrochemistry applications. Prior to this role, Katie spent 16 years as a RF design engineer, Product Manager and Applications engineer in the semiconductor and RF test equipment market. Katie has been involved in the definition and introduction of a wide range of products including RF power meters, long range acoustic hailing devices, and parameter analyzers. She holds a Bachelor of Science degree in Electrical Engineering from South Dakota School of Mines & Technology and a Master’s of Science in Engineering Management from Florida Institute of Technology.