Wrapping up the series, in Part 3 we model and simulate the example synthesizer PLL section loop dynamics and measure its critical characteristics, which demonstrates the excellent performance achieved using the technique.
Accurate evaluation of device characteristics requires testing by injecting multiple types of jitter on the device under test (DUT). This paper explains types of jitter, guidance on measurements for complex jitter tests and examples of jitter tolerance measurements using Anritsu’s Signal Quality Analyzer-R MP1900A high-performance BERT.
