Date: May 29, 2025
Time: 11:00 AM EST / 10:00 AM CST / 8:00 AM PST / 3:00 PM GMT
Sponsor: Tektronix
Duration: 1 Hour
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As power electronics evolve, many designers are making the shift from silicon (Si) to silicon carbide (SiC) to take advantage of higher efficiency, faster switching speeds, and improved thermal performance. However, this transition also introduces new design and testing challenges, including high-speed signal integrity, EMI concerns, and the need for precise high-voltage measurements.
In this session, experts from Tektronix, Wolfspeed, and PE Systems will explore critical considerations for successfully integrating SiC into your designs.
Through real-world measurement demonstrations, we’ll:
• Highlight common pitfalls in SiC-based power system testing
• Share best practices to improve measurement accuracy and reliability
• Showcase advanced solutions—like Tektronix’s IsoVu™ isolated probe technology—for high-fidelity validation
Whether you're designing for increased power density, reduced losses, or enhanced system reliability, this session will give you the practical insights and tools to optimize your SiC testing strategy. Join our expert speakers and see real-world techniques in action—register now to reserve your spot!