September 18, 2025
2:00 PM ET / 1:00 PM CT / 11:00 AM PT / 7:00 PM GMT
Duration: 1 hour
Already registered? Click here to log in.
Summary
PCI-SIG’s PCIe 6.0 standard switched from NRZ to PAM4 to handle 64 GT/s. At the speed, the intra-pair skew between the differential signals becomes very critical. This type of high-speed backplane and interconnect needs to minimize eye margin as this can have a huge impact on errors in the data transmission.
This webinar presents a unique test capability of intra-skew including a practical method to characterize the skew versus BER (Bit Error Ratio). It also highlights a novel and reliable method for introducing granular intra-pair skew into the channel and measuring the impact of BER.
Speaker
Anritsu Company
Hiroshi Goto is a seasoned expert in high-speed and optical engineering, bringing over 35 years of innovation and leadership at Anritsu Company. Throughout his career, he has worn many hats—Design Engineer, Product Marketing Engineer, and now High-Speed & Optical Product Manager and Sr. Business Development Manager—each role deepening his expertise in cutting-edge signal integrity and optical communication technologies.
A Physics graduate from Aoyama Gakuin University in Tokyo, Mr. Goto has played a pivotal role in advancing industry standards, authoring numerous application notes and white papers, and frequently sharing his insights as a respected speaker at industry events. Residing in the Dallas area, he continues to drive innovation in high-speed data transmission and optical networking, ensuring the future of high-performance communications.
Supported by: