USB4 Version 2.0 (USB4v2)Testing: Practical Tx/Rx Validation for PAM3 Signaling

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USB4 Version 2.0 (USB4v2) raises the bar for high-speed interconnect validation by doubling throughput over existing USB4v1 physical layers while introducing PAM3 signaling. That shift enables higher data rates, but it also reduces symbol-level separation and increases sensitivity to noise, inter-symbol interference (ISI), and channel stress, making traditional eye analysis and margining approaches less sufficient for confident compliance testing.

For engineers validating USB4v2 designs, the challenge is no longer simply measuring faster signals; it is understanding how PAM3, asymmetric operation, receiver stress calibration, and evolving PHY-layer requirements change the way Tx and Rx performance must be characterized.

In this 60-minute technical webinar, experts from Tektronix and Anritsu will walk through the critical aspects of USB4v2 PHY testing, focusing on emerging test requirements, practical techniques, measurement strategies, and tools for accurate Tx and Rx characterization across symmetric and asymmetric operating modes.

What You Will Learn:

• Key USB4v1 and USB4v2 PHY-layer testing challenges introduced by PAM3 signaling
  
  

• Transmitter testing techniques, including:
• How PAM3 impacts noise sensitivity, SNDR, ISI, and margin assessment
• Practical transmitter test considerations for accurate USB4v2 characterization, including asymmetric mode operation
  
  

• Receiver validation and stress testing, including:
• Receiver validation of TER test, Frequency Variation Test, and LFPS test
• Stress calibration approaches, including Case 1, Case 2a, and Case 2b calibration
• How a joint Tektronix + Anritsu test solution supports comprehensive USB4v1 and USB4v2 Tx/Rx validation