App Note: Double Pulse Testing for Modern Power Semiconductor Devices

Double pulse testing (DPT) is a widely used method for evaluating switching performance and dynamic behavior in power semiconductor devices such as MOSFETs and IGBTs. By applying controlled pulses, engineers can measure key parameters while limiting self-heating and maintaining stable test conditions. As SiC and GaN devices push faster switching speeds and higher power density, accurate measurement of switching loss, timing, and reverse recovery is essential for optimizing efficiency and validating designs.

This application note provides a practical guide to implementing DPT using an oscilloscope and arbitrary function generator, helping you achieve accurate and repeatable results.

Inside you’ll learn:

• How to generate double pulse signals using an AFG
• How to measure switching loss, timing, and reverse recovery
• How to set up a complete DPT test system
• Best practices for accurate, repeatable measurements