Tom joined EE as Senior Technical Editor in 1998, writing feature articles and special reports on a wide range of topics stemming from extensive USA and UK instrumentation design and marketing experience. Tom earned an MSEE degree from New York University and a BSEE from Case Institute of Technology and holds several display and control-related patents.
Most Recent
Most Recent
Test & Measurement
Keeping track of what you’ve got
March 20, 2017
Special Reports
Modal math may not add up
Feb. 22, 2017
Test & Measurement
Defending against cyberattacks
Feb. 22, 2017