The GR228X i Series Test System offers high throughput and high fault coverage for analog, digital, mixed-signal and memory testing. It has a small footprint and an ergonomic design with power tilt for integration into automated production lines. When integrated with board handling equipment, the i Series allows full access to test system electronics, simplifying pin-count expansion and upgrades.
Models GR2283i and GR2284i have 256 bi-directional test points expandable to 1,920; Models GR2286i and GR2287i have 640 points expandable to 3,840; and Models GR2280i and GR2281i, 896 points expandable to 1,408.
Software includes AutoDebug, Automatic Fault Grading, Test Execution, Memory Bank Test and Junction Xpress™ vectorless test. ATG XPRESS™ is standard with the GR2280i and GR2281i and an option with the other models. From under $100,000. GenRad, (800) 4-GENRAD.
Copyright 1996 Nelson Publishing Inc.
July 1996
