The SC m (Micro)™ Tester has multisite testing capabilities that allow testing of up to 16 devices in parallel, reducing test time of digital and digital mixed-signal devices with embedded RAM and EPROM. In a single insertion, it can test all digital functions, DACs, and ADCs as well as EPROMs.
A new software tool, the Opcode Analyzer™, eliminates the task of interpreting binary vector data. With Opcode Analyzer, you can debug disassembled microcode and develop customized code libraries unique to each microcontroller family.
Analog Pin Electronics™ and Analog Wave Tool™ are used for digital mixed-signal applications. An integrated library of DSP functions supports full analog test capabilities. Credence Systems, (510) 657-7400.
Copyright 1996 Nelson Publishing Inc.
October 1996