The Integra J750 Test Series delivers 512 or 1,024 digital pins in a test head-only system. It provides 100-MHz full-featured digital capability including timing, formatting, and period switching on the fly. Pattern-controlled instrumentation is offered for testing embedded memory and analog cells.
Instrumentation per site (up to 32 high-voltage drivers, 32 power supplies, and 32 converter test options), asynchronous pattern control, and per-site programming accommodate testing of 32 devices in parallel. The system also features IG-XL test software, a worksheet-based environment built on Windows NT. The software integrates off-the-shelf tools such as Microsoft Excel and Visual Basic to simplify creation of test programs. $1,000 to $2,000 per pin. Teradyne, (617) 482-2700.
Copyright 1998 Nelson Publishing Inc.