New capabilities in TetraMAX® ATPG and Yield Explorer decrease the time, effort, and cost of deploying a volume diagnostics flow and speed up yield ramp. TetraMAX ATPG identifies potential defects from scan test failures, using physical design data to improve diagnostics accuracy. Yield Explorer analyzes the potential defects across multiple failing devices to uncover systematic yield issues, also using physical design data to identify specific yield-limiting layout geometries. New support of industry-standard formats maximizes engineering productivity: LEF/DEF facilitates one-time import of physical design data, and STDF V4-2007 enables transfer of defective silicon data from industry-leading testers.
