Test Set Support for P25
Vehicle Dynamics Testing
The Model CDS-GPS Datalogger with built-in GPS for longitudinal vehicle dynamics testing applications is fully compatible with other sensors within the company’s Corrsys-Datron product range. The CDS-GPS offers an update rate of 100 Hz with GPS signal output via the CAN bus. With simple and quick vehicle mounting capabilities, it provides measurements of absolute speed, traveled distance, latitudinal and longitudinal position, height, time and date, and system-status information such as the number of satellites, signal quality, and other factors.
The CDS-GPS supports braking tests, acceleration and deceleration tests, fuel consumption assessments, tire validation, ABS brake testing, irregular brake-force balance monitoring, and the optimization and fault diagnostics of other vehicle electronic control systems. In addition, the units are programmed with predefined driving maneuvers for longitudinal dynamic measurements.
63-GHz Oscilloscopes
The 90000 Q-Series improves upon Agilent’s use of custom ICs and multichip module packaging with a new technology called RealEdge. RealEdge comprises a combination of new architectures, next-generation microcircuit and thin-film components, and advanced application of the company’s indium phosphide semiconductor process. The technology enables high-frequency capability while maintaining a low jitter-measurement floor (75 fs).
Contactor for Digital Applications
Testing such devices can be complicated by issues relating to contactor bowing, limited compliance, and test-handler force limitations. The Triton solves these challenges by offering an enhanced compliance window to accommodate stack-height variations. It provides optimized force to support large BGAs and LGAs as well as multisite package test and offers up to 20-GHz differential bandwidth.
ATE for ASSPsThe Diamondx Semiconductor Test System targets ASSPs and complex microcontrollers in wireless and mobility applications as well as consumer ICs. The system offers a universal instrument slot architecture, allowing easy scaling from single-site to multisite, from digital only to mixed-signal to RF ASSP configurations. Its small footprint makes it suitable for lab development and high-volume production. A PCI-Express2 Data Bus supports up to 80-Gb/s bidirectional transfer between the system CPU and the test head.
Diamondx can be configured with multiple digital, power, mixed-signal, and RF instruments and can accommodate more than 5,000 pins.
PXIe Controller
To improve the serviceability and minimize downtime, the PXIe-8115 provides in-ROM and hard-drive diagnostics to determine the controller’s health. By combining the controller with NI LabVIEW system design software, engineers can gain efficiency in a variety of test, measurement, and control applications.
From $4,499.
High-Voltage Instrument
Dual-Channel Waveform Generators
The WaveStation Series of function/arbitrary waveform generators produces signals up to 50 MHz and offers a 3.5” color display, an intuitive front panel, two output channels on all models, and PC waveform editing software. The models are available with bandwidths of 10 MHz, 25 MHz, and 50 MHz, each with a 125-MS/s sampling rate, 14-bit resolution, and 16-kpoints memory per channel. From $990 to $3,450.
Multitone RF Test System
AR RF/Microwave Instrumentation
Calibration Software
CalEasy v1.0 allows users to verify and recalibrate the company’s PXI instruments. The initial release includes support for the GX5960 and GX5055 digital instrumentation, with subsequent releases incorporating support for all the company’s products. CalEasy offers users the ability to verify performance and, if needed, recalibrate Geotest instrumentation on-site, eliminating the need to return the instrumentation to the company or to use a third-party calibration service.
Benchtop IR Inspection System
The BT-IR yields submicron-precision optical measurements, and its staging provides up to 0.1-micron linear encoder resolution. In addition, the system features a high-resolution 900-nm to 1,700-nm InGaAs digital camera. The system has a motorized X-Y stage with joystick controls to navigate, observe, and measure bonded wafer/die alignments; find defects in a manual mode; and determine material stress via the system’s optional birefringence capability.
Programmable DC Supplies
Enhancements to the product controls and calibration procedures enable an over five-fold improvement in accuracy. Accuracy specifications are now ±0.075% of full-scale voltage/current programming and ±0.2% of full-scale voltage/current monitoring. An electronic output bleeder stage is among the other new features, and the supplies now come standard with an integrated EMI filter.
PXI Communications Controller
CompactPCI Blade
Parametric Test Systems
Two versions are available: The S530 Low-Current System measures characteristics such as subthreshold leakage and gate leakage. The S530 High-Voltage System incorporates a source-measurement unit capable of sourcing up to 1,000 V at 20 mA (20 W max) to any system pin.