Teseda Corp. announced that ON Semiconductor, a supplier of silicon-based solutions for energy-efficient electronics, has purchased multiple Teseda DI Lab Systems for failure analysis and defect isolation.
Teseda’s DI Lab System is a core design engineering tool used for first silicon bring-up, product engineering, and failure analysis. It provides a complete bench-top device stimulus and failure-analysis system to perform defect isolation and thus enhances semiconductor device performance.
“Mixed-signal application-specific integrated-circuit (ASIC) technologies, higher metallization density schemes, on-chip dissipation techniques, and intelligent packages are continuously challenging our failure analysis teams to identify failure mechanisms and determine root cause,” said Pascal Vercruysse, engineering manager of Global Labs at ON Semiconductor. “The powerful and compact Scan Test Teseda system, with its diagnostic software, enables us to create a closed-loop environment with traditional failure-analysis techniques and state-of-the-art emission analysis tools. The integration of scan-chain information, failure data, and layout information into a single physical viewing environment provides highly effective analysis power to the analyst. Teseda’s data-analysis capability allows us to study subtle behavioral patterns and identify even those defects that are, in other circumstances, often overlooked and would remain undetected.”
ON Semiconductor has standardized on Teseda for its central failure analysis labs located in Europe, North America, Japan, and the Philippines.
“The adoption of the DI Lab System at multiple ON Semiconductor worldwide locations is the result of a strong collaboration with our customer to provide a solution that best meets their requirements,” said Armagan Akar, chief executive officer at Teseda. “We will continue our collaborative work with ON Semiconductor and all our customers to meet their future and expanding needs.”
The Teseda DI Lab System is a complete system package of Teseda’s patented technology for device test, failure analysis, and defect isolation. The Teseda DI Lab System, designed from direct user experiences, includes the complete suite of Teseda tools to address the critical needs in device analyses. The DI Lab System hardware is a portable, light-weight, and low-noise diagnostic test system for ease of integration with failure-analysis imaging or analysis systems such as emission scopes using techniques such as optical-beam-induced resistance change (OBIRCH), laser-assisted device alteration (LADA), light-induced voltage alteration (LIVA), and thermally induced voltage alteration (TIVA). The user can perform multiple tests with pause, looping, or free-running clocks for device stimulus. Defect Isolation is performed by mapping mismatching scan cells against the physical design of the device, then applying patented software algorithms and navigation techniques on the device to precisely locate the failing circuit element.
