CEA-Leti to share insights into post-7-nm technologies

Dec. 2, 2015

Grenoble, France. As part of its ongoing mission to help its industrial partners implement competitive, leading-edge semiconductor capabilities, CEA-Leti will present new details about its R&D efforts in post-7-nm CMOS device architectures, materials, and computing-system paradigms during IEDM 2015.

“Our tradition is to take a broad, production-oriented approach to technology development, to reduce risks and accelerate the transition into high-volume manufacturing, and this is our approach for the post-7-nm realm,” said Olivier Faynot, manager of Leti’s Microelectronic Section. “Our interdisciplinary exploration and analysis of upstream factors, like neuromorphic computing, gives us a strategic perspective on device-level requirements, which in turn helps us evaluate options for new materials, transistor designs and integration techniques.”

Faynot will share details on the latest results on ultra-low-power atomic-scale devices at a LetiDay event on Dec. 6. He said that while electrostatics and device drivability pose important challenges, power efficiency will be the key issue in post-7-nm generations, which industry roadmaps estimate will enter production in the 2019 timeframe. Leti strategic marketing manager Carlo Reita noted during a LetiDays event in Grenoble earlier this year that nonrecurring engineering costs for these device generations will be measured in the billions of dollars, underscoring the need for more-efficient design and implementation measures.

“We believe the solution to these power issues will be provided by a combination of new-generation CMOS logic, likely utilizing stacked nanowires, and resistive RAM memory technology, integrated using 3D approaches,” Faynot said. “This is why we have been reporting regularly on progress in these fields, as well as on new system architectures that will take best advantage of the remarkable new capabilities these devices will provide.”

Leti researcher Sylvain Barraud, who will be awarded the Paul Rappaport IEEE Prize at IEDM, demonstrated a viable integration path for stacked nanowires at the IEEE S3S Conference in October. In addition, benchmark studies demonstrate that stacked nanowires offer the best trade-off in terms of performance and parasitic capacitances, the key for energy efficiency.

Leti has about 20 scientists and engineers engaged in post-7-nm development, plus an additional 10 researchers from partners, including IBM, STMicroelectronics, and academic labs. Expertise ranges from solid-state physics and materials science to circuit-and-systems design and advanced manufacturing, so that potential problems are identified and addressed early on. This facilitates rapid production ramp-up and adoption of high-volume products.

www.leti.fr

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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