Mendham, NJ. The Power Sources Manufacturers Association (PSMA) and the IEEE Power Electronics Society (IEEE PELS) are jointly sponsoring the third high-frequency magnetics workshop, “Power Magnetics @ High Frequency—Eliminating the Smoke and Mirrors,” on Saturday, March 3, 2018. The workshop will be conducted on the day before and in the same venue as APEC 2018 in San Antonio, TX.
This day-long event will continue the workshop series’ focus on identifying the latest improvements in magnetic materials, coil (winding) design, construction and fabrication, evaluation and characterization techniques, and modelling and simulation tools to target the technical expectations and requirements of higher application frequencies while addressing two specific issues of interest: measurement and reporting of data to improve modelling of AC power loss measurements and the impacts of fringing effects on power magnetics performance. The target audience for this workshop is anyone working to achieve higher power densities, low profile aspect ratio, higher efficiencies and improved thermal performance.
The first two workshops were completely sold out, so individuals interested in attending this year’s event are encouraged to register early.
The workshop will consist of morning (AC power losses) and afternoon (fringing effects) technical lecture presentation sessions and a lunchtime interactive technology demonstration session. The two technical lecture presentation sessions will each be followed by a panel Q&A period. The technology demonstrations will also be available during the breakfast prior to the opening session and during the networking session at the end of the day’s events.
Ed Herbert, the magnetics committee cochairman said, “With the move toward higher switching speeds driven by advances in SiC, GaN, and silicon switching devices, magnetics is playing an ever-increasing role in the ultimate performance of power conversion topologies. The popularity of our previous workshops simply underscores the importance of this topic.”