Test Setup Checks Transistors’ hFEs When Tight Control Is Important (.PDF Download)

Feb. 20, 2013
The spread of hFE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a system. Consequently, bench evaluation of hFEmay be required during the system’s development stage.

Register or Sign in below to download the full article in .PDF format, including high resolution graphics and schematics.