Multitest Ships MEMS Test and Calibration Equipment

January 12, 2012. Multitest announced that it has shipped the first Multitest MEMS equipment for the MT9510 pick-and-place test handler to an IDM in the U.S. This new combination is based on the MT MEMS and MT9510 platforms. The installation is for MEMS gyroscope test and has already been successfully installed, the company reports.
 
The combined platforms leverage Multitest’s long-term MEMS test capabilities as well as its understanding of the challenges in DUT handling to bring the positioning accuracy and tri-temp performance of the MT9510 to MEMS test applications.
 
The MT MEMS platform supports easy docking and undocking of the MEMS modules to the standard test handler and provides for test in the in ambient, hot, and cold environments. The platform is easily convertible to various package styles. MT MEMS modules are available for a variety of sensor test applications: for singulated devices, for cost-efficient strip test, and for test in carriers. A down-scaled engineering setup is available.
 
The MT9510 XP offers up to 8 contact sites and tri- temp performance from -55 to 175 °C. Kits support QFP, BGA, PGA, QFN, and other packages. Index time 0.38 s; throughput can reach up to 5,300 UPH. The system supports standard, high frequency, and Kelvin contacting.
 
Multitest said it already has received additional orders for package conversion kits and other systems.
 
Multitest,  www.multitest.com/MEMS.