Carrier/Noise Generator Sees 66% Hike In Reliability

March 1, 2004

The UFX-EbNo series of precision Carrier/Noise (C/N) generators from Noise Com now features a swept-frequency software upgrade that boosts reliability by up to 66% when testing wireless local-area network (LAN), cable modem, satellite, and military systems. The software upgrade's novel calibration routines enable reliable and repeatable results in bit-error-rate (BER) versus C/N tests as well as in bit energy-to-noise (EbNo) density tests.

"The substantial increase in reliability provides designers with the confidence in achieving the long-term accuracy and repeatability required of communications systems," says John Kenneally, Noise Com's vice president.

The C/N generators are fully automated instruments with five operating modes: C/N, EbNo, carrier-to-noise (C/No) density, carrier-to-interferer (C/I), and noise generator. They operate from 5 MHz to 44 GHz. The software upgrade, priced at $5000, is available now.

Noise Comwww.noisecom.com (201) 261-8797

About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.