SSRs Enhance Reliability of ATE

April 6, 2005
From International Rectifier, the PVY117 Series microelectronic relays (MERs) are designed to increase reliability, lower power consumption, and reduce space requirements in low-voltage and high test frequency semiconductor automated test equipment ...

From International Rectifier, the PVY117 Series microelectronic relays (MERs) are designed to increase reliability, lower power consumption, and reduce space requirements in low-voltage and high test frequency semiconductor automated test equipment (ATE) and other instrumentation. These solid-state relays (SSRs) also are suited for use in low-voltage audio and RF switching applications.

The SSRs are meant to replace electromechanical and reed relays, which have fragile moving parts and metallic contacts, and are consequently less reliable like semiconductor based switches. The SSRs also require less power for actuation and occupy less space than the electromechanical relays they replace. In addition, the MERs feature bounce-free operation.

The PVY117 Series devices feature 4-pin SOIC packages, a ±40-V off-state blocking voltage, a 0.96-Ω max on-resistance, a 14.5-pF max off-state capacitance, and a 1-nA max leakage. In addition, max Ton/Toff times are specified at 200 µs/100 µs. Pricing starts at $2.75 each in 10,000-unit quantities.

Data sheets and a reliability report for the PVY117 series are available at www.irf.com.

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