Nikon, Synopsys Offer 45nm Manufacturing-Aware Solution

Sept. 18, 2007
Nikon Corporation, which supplies lithography equipment for microelectronics manufacturing, said its optical lithography exposure tool data is available for the latest release of EDA giant Synopsys' Proteus optical proximity correction (OPC) software.

Nikon Corporation, which supplies lithography equipment for microelectronics manufacturing, said its optical lithography exposure tool data is available for the latest release of EDA giant Synopsys' Proteus optical proximity correction (OPC) software. As part of an ongoing collaboration, the two companies developed an embedded scanner parameter module, which delivers the "manufacturing-aware" OPC and resolution enhancement technology (RET) lithography simulation models needed to make chips at 45nm and below. At these sizes, critical dimension (CD) control takes place at the single nanometer level. Current OPC design tools use idealized models of lithography tools to synchronize with the mask pattern. The pattern can only be optimized by comparing the simulated model to the calibrated exposure results, an approach that may not produce accurate, predictable models, according to a Synopsys release. That's why Nikon and Synopsys collaborated to develop a "manufacturing-aware" OPC solution that provides improved modeling accuracy. The new interface gives Proteus modeling customers access to Nikon's proprietary scanner information, including such higher-order lithographic effects like polarization, flare, synchronization, and various aberration data. This methodology can accurately predict lithographic printing effects previously missed with traditional "idealized" OPC models, according to Synopsys, increasing OPC modeling accuracy and reducing OPC modeling time. "By incorporating our proprietary scanner information into the Proteus software, Nikon customers can gain a competitive advantage with improved OPC accuracy and faster optimization time," Toshikazu Umatate, executive officer of the precision equipment company at Nikon, said in a statement. "Combining proprietary lithography information from Nikon with Proteus mask-synthesis data moves OPC accuracy into a new domain leading to improved CD control at 45 nanometers and below," Wolfgang Fichtner, senior VP and general manager of the silicon engineering group at Synopsys, said in a statement.

Sponsored Recommendations

What are the Important Considerations when Assessing Cobot Safety?

April 16, 2024
A review of the requirements of ISO/TS 15066 and how they fit in with ISO 10218-1 and 10218-2 a consideration the complexities of collaboration.

Wire & Cable Cutting Digi-Spool® Service

April 16, 2024
Explore DigiKey’s Digi-Spool® professional cutting service for efficient and precise wire and cable management. Custom-cut to your exact specifications for a variety of cable ...

DigiKey Factory Tomorrow Season 3: Sustainable Manufacturing

April 16, 2024
Industry 4.0 is helping manufacturers develop and integrate technologies such as AI, edge computing and connectivity for the factories of tomorrow. Learn more at DigiKey today...

Connectivity – The Backbone of Sustainable Automation

April 16, 2024
Advanced interfaces for signals, data, and electrical power are essential. They help save resources and costs when networking production equipment.

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!