Cadence And Credence Partner On DFT Technology

June 24, 2002

With system-on-a-chip (SoC) complexity rising dramatically, so too has the total cost of testing these devices. A technology partnership between Cadence Design Systems of San Jose, Calif., and Credence Systems of Fremont, Calif., will create design-to-production test methodologies based on an open architecture. As a result, users will be able to manage their test-methods portfolio across the supply chain, accelerating time-to-market and reducing overall cost of testing.

The companies plan major improvements in the design-to-production test flow by integrating test requirements into the design process. They'll also work toward open, industry-standard means of migrating those test parameters into the engineering validation and production test environments.

Initially, Cadence and Credence will integrate software to create a test-validation environment for the IC design-for-test (DFT) engineer. This software will be available through Cadence sales channels.

Verification design tools from Cadence (NC-Sim) will be combined with test automation and debug tools (Digital Virtual Test/Test Development Series) from Credence's subsidiary, Integrated Measurement Systems Inc., to build a streamlined design-to-production test flow.

The flow will encompass design implementation, test validation/debug, cyclization, and test program development. Both companies will devote engineering resources to the joint effort.

For details, go to www.cadence.com or www.credence.com.

About the Author

David Maliniak

MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.