More EDA Tool News

April 28, 2003
> Version 4.1 of the Specman Elite testbench automation tool from Verisity includes e Reuse Methodology features. The upgrade increases the power of Verisity's e Verification Components to generate and synchronize complex multitransaction...

> Version 4.1 of the Specman Elite testbench automation tool from Verisity includes e Reuse Methodology features. The upgrade increases the power of Verisity's e Verification Components to generate and synchronize complex multitransaction scenarios. It's supplemented by seven new e Verification Components for PCI/PCI-X, PCI Express, Gigabit Ethernet, and other popular protocols. Visit www.verisity.com.

> The HSIM, Lexsim, and Critic simulation and analysis tools from Nassda now offer integration with digital logic simulation and Verilog-A language support. Version 3.0 of the tools provides faster, higher-capacity verification for systems-on-a-chip combining analog, mixed-signal, digital, and memory IP components. Details are at www.nassda.com.

> The software for field-programmable analog arrays (FPAAs) from Anadigm now includes point-and-click implementation of analog dividers, complex Bessel filters, and gain-polarity stages. The AnadigmDesigner2 tool delivers these and other components as configurable analog modules (CAMs) that can be customized and implemented within an FPAA, with drag-and-drop ease. Evaluation kits cost $499. Trial copies can be downloaded from www.anadigm.com/Down_05-a.asp.

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.

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