EE Product News

Established Test Platform Adds Mixed-Signal Option

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The Integra J750 VLSI test system now offers a mixed-signal option (MSO) that allows the system to source, capture and analyze analog signals, as well as the digital representation of analog signals. Using the option, the system can test mixed-signal ASICs with voice, audio, baseband and video test signal requirements up to a 20-MHz frequency range.
The MSO consists of a low-to-mid frequency analog signal I/O module and a digital signal I/O module. Both provide multiple device test channels on each module, with up to 32 instruments or sites capable of performing tests in a parallel manner. The parallel test technology is said to significantly improve throughput.

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