EE Product News

Instruments Readied For Tomorrow's Wireless Systems

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Although still in the development stage, third-generation (3G) wireless subscriber and infrastructure equipment poses complex test challenges. Two instruments now offer capabilities to address 3G and other emerging applications.The TAS 4500 FLEX4 RF channel emulator gives accurate, repeatable emulation of multipath fading, delay spread and path-loss characteristics for wireless communication channels. The TAS 4600A noise and interference emulator provides characterization of carrier-to-noise and carrier-to-interference performance of wireless systems over a wide range of repeatable test conditions.

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