EE Product News

Tester Checks Laser Diode Assemblies Over Wide Range Of Temperatures

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The new Photonics ET-48 laser diode test system is designed to check the performance of packaged laser diode assemblies. The system can subject these assemblies, including output fibers and connectors, to a wide range of test temperatures, while monitoring key operational test parameters. It can monitor forward current and voltage, front facet optical output, photodiode output, thermoelectric cooler (TEC) voltage and current, and thermistor temperature of the device.
The test system's computer-controlled environmental chamber combines specialized modular fixtures for packaged or chip-on-submount (CoS) devices with high-volume airflow to ensure uniform temperature distribution within the chamber. Cooling options include closed-cycle refrigeration and liquid nitrogen—the latter offers rapid thermal slew rates over an operating temperature range of -60°C to 150°C.

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