50th International Test Conference to begin Nov. 12 in Washington, DC
The 50th International Test Conference will take place Nov. 12-14 in Washington, DC, and it will cover topics including test of devices, boards, and systems—covering the product lifecycle gamut including design verification, test, diagnosis, failure analysis, and process and design improvement.
In addition to technical topics, the conference will address business aspects ranging from venture capital funding to challenges related to the Air Force’s supply-chain management.
Six keynote speeches and five “visionary talks” spread throughout the three days of the conference indicate topics of interest this year.
Mike Campbell, senior vice president of engineering, Qualcomm, will get the conference started with a Tuesday morning keynote titled “A new era for Test and test complexity.” He will be followed by Aart de Geus, chairman and CoCEO of Synopsys, who will suggest that ITC has many more years to run. The title of his visionary talk: “50 Years… Good Start!”
Other topics will center on big data and analytics. For example, Keith Schaub at Advantest will deliver a talk titled “Semiconductor test—Towards a data-driven future.” And John Kibarian, president and CEO, PDF Solutions, will deliver a talk titled “The Outlook for Manufacturing Test in a Future Driven by Big Data Analytics and the IIoT.”
Automotive will also be a focus. For example, Kevork Kechichian, senior VP of engineering at NXP will discuss “The Transistor Squeeze—New Challenges in Automotive SoCs.” And Andreas Aal of VW AG will discuss “The impact of functional safety and cybersecurity assurance on the role of testing for autonomous vehicle electrical system designs.”
Addressing cybersecurity from a military/aerospace perspective will be Serge Leef, program manager, DARPA, who will offer a keynote speech titled “Incorporation of Security into Chip Design.”
Evolution of ATE architectures and processes will also be a topic of interest. Gregory Smith, president, Semiconductor Test Division, Teradyne Inc., will discuss “How Semiconductor Complexity Drives ATE Architecture.” And Joseph Sawicki, executive vice president, IC EDA, Mentor, a Siemens Business, sill discuss “Moving from Production Test to Life Cycle Management.”
Looking toward the future, Leon Stok, vice president, IBM, will discuss “Design and Test of Quantum Computers.” And Giovanni de Micheli, director, IEE Center, EPFL, will discuss “Democratic circuits for a safer and greener tomorrow.”
A Program “sneak peek” suggest that technical sessions and panels will drill down on these topics and add some more.
Sessions will address defect and failure characterization, system and memory test, analog and scan security, artificial intelligence, delay test, resilience and system test, automotive test, 3D chip test, test standards, and test of memory-centric computing paradigms
In addition, ITC will include the Global Test Forum, which will feature contributions of prominent test-technology-related conferences and workshops established around the globe over the past 50 years.
For more information visit http://www.itctestweek.org/ or https://www.facebook.com/pg/itctestweek/posts/.
