IEEE Std.1149.1: The IP Test Evolution (Part 2) (.PDF Download)

We’ll let you decide: “Is it an IP test evolution or revolution?” Whatever the outcome, change is afoot on the way to develop test, supply test to others, reuse test, integrate test features, validate test, and target tests to manufacturing. IP providers, chip integrators, verification and validation, test and product engineering, failure analysis, board test, and system testing will be affected by the new